Observation of a trap effect in N/SNS/N structure

Jian Wei,Yumin Hou,Pengcheng Song,Mingling Chen,Ke Wu,Shousheng Yan
DOI: https://doi.org/10.1016/S0921-4534(00)01441-6
2000-01-01
Abstract:The dV/dI-V curve of Cu/Nb-Cu-Nb/Cu structure with superconductor/normal metal (S/N) interface parallel the current was measured at liquid helium temperature. Resistance rapidly regains and shows a step like feature when the bias is lowered than Delta (Nb)/e. This result can't be explained by conventional theory. A trap effect due to Andreev reflection is proposed to interpret the result.
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