Study of modified mica by AFM

Shenwen Fang,Dong Zhao-xiong
2007-01-01
Abstract:The surface topography of mica modified by 3-(trimethoxysilyl)propyl methacrylate(KH-570) was studied by atomic force microscope(AFM).Surface parameters such as roughness Rq,particle height D and the highest value at Z direction were measured.The influence of several factors on the surface topography of modified mica was investigated,including rinse,the concentration of KH-570 and the order of rinse and drying.The results indicated that the value of Rq was affected by the point defect on mica surface,rinse and the disposal after modification,while the morphology of KH-570 molecular aggregate was depended on the concentration of KH-570.As the concentration reduced,the morphology changed from cross-linked web to divergent points.
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