Effects of Plant Growth Regulators and Density on Major Characteristics of Wheat

DONG Jing,Yang Yan-bin,XU Fu-chao,GE Shuang-tao,WANG Xian-zhi,Gao Guang-jin,LI Mei-fang
DOI: https://doi.org/10.3969/j.issn.0439-8114.2008.12.009
2008-01-01
Abstract:A field experiment was conducted to study the effects of plant growth regulators and density on plant height,lodging resistance and yield of wheat variety E352.The results showed that as the density increased,plant height,lodging level and ear number per plot increased,but the grain number per ear decreased.A higher yield was available with 2.25× 104 plants per hm2.When spraying with PP333 at the concentration of 250mg per kilogram or CCC of 200 mg per kilogram,plant height was reduced,but lodging resistance was enhanced.Compared with CCC,the treatment of PP333 showed better.Moreover,when spraying with PP333 at the concentration of 250mg per kilogram,ear number per plot increased,but the grain number per ear and 1000 grain weight didn't decrease,sequently the yield increased.For E352,an ideal yield could be achieved,with a preferable combination of planting 2.25×104 plants per hm2 and spraying with PP333 at the concentration of 250mg per kilogram before elongation stage.The role of CCC needed further study.
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