A Design of the Temperature Test System Based on Grouping DS18B20
Li Ping,Zhou Yucai,Xiangjun Zeng,Yang Ting-fang
DOI: https://doi.org/10.1109/iciea.2007.4318396
2007-01-01
Abstract:All the DS18B20 sensors, used for the multipoint test temperature, are connected with MCU on one of IO bus, and temperature data are collected by turns. If the system has a large amount of sensors, the time of MCU used in processing the temperature data is obviously prolonged, so the cycle of alternate test gets longer. In this paper, a new method that DS18B20 are rationally grouped is presented, and some measures are taken in software; as a result, the speed of alternate test advances distinctly.