Abstract:The scattering of light by dielectric particles much larger than the wavelength of incident light is attributed to diffraction, external reflection and outgoing refracted waves. This paper focuses on diffraction and external reflection by faceted particles, which can be calculated semi-analytically based on physical optics. Three approximate methods; the surface-integral method (SIM), the volume-integral method (VIM), and the diffraction plus reflection pattern from ray optics (DPR) are compared. Four elements of the amplitude scattering matrix in the SIM and the VIM are presented in an explicit form. Of interest is that diffraction and external reflection are separable in the SIM, whereas they are combined in the VIM. A feature of zero forward reflection is noticed in the SIM. The applicability of the DPR method is restricted to particles with random orientations. In the manner of van de Hulst, we develop a new technique to compute the reflection pattern of randomly oriented convex particles using spheres with the same refractive index, resulting in an improvement in the precision of the reflection calculation in near-forward and near-backward directions. The accuracy of the aforementioned three methods is investigated by comparing their results with those from the discrete-dipole-approximation (DDA) method for hexagonal particles at the refractive index of 1.3+i1.0. For particles with fixed orientations, it is found that the SIM and the VIM are comparable in accuracy and applicable when the size parameter is on the order of 20. The ray-spreading effect on the phase function is evident from the results of various size parameters. For randomly oriented particles, the DPR is more efficient than the SIM and the VIM.

Lateral Shift Effect on the Spatial Interference of Light Wave Propagating in the Single-Layered Dielectric Film.

Rigorous analysis of the spatial dispersion effect in multilayer thin-film coatings.

Spatial Effect on the Interference of Light Propagated in a Film Structure.

Light Interaction with Multilayer Arbitrary Anisotropic Structure: an Explicit Analytical Solution and Application for Subwavelength Imaging

The Goos-Hanchen Shift on the Surface of Uniaxially Anisotropic Left-Handed Materials

The near-zone field characteristics of an E-polarization plane wave penetrating through cylindrical multiple apertures (non) coated with lossy and lossless media

Measurement of Absolute Phase Shift on Reflection of Thin Films Using White-Light Spectral Interferometry

Diffraction and External Reflection by Dielectric Faceted Particles

Positive and Negative Spatial Dispersion Effects of Optical Thin Films

Large Negative and Positive Lateral Shift on Reflection from a Left-Handed Prism Coated with a Weakly Absorbing Dielectric Film

Optical interference on the measurement of film-depth-dependent light absorption spectroscopy and a correction approach.

Negative and Positive Lateral Shift of a Light Beam Reflected from a Grounded Slab.

Study of the Moving Multilayer Slab Acted by Oblique Incidence Electromagnetic Wave Using the Transfer Matrix Method

Lateral Displacement of an Electromagnetic Beam Reflected from A Grounded Indefinite Uniaxial Slab

Spin Displacements of a Gaussian Beam at an Air–multilayer-Film Interface

Lateral Shifts of Linearly- and Radially-Polarized Bessel Beams Scattered by a Nanosphere.

Lateral Beam Shifts and Depolarization Upon Oblique Reflection from Dielectric Mirrors

Large Lateral Shift Near Pseudo-Brewster Angle on Reflection from a Weakly Absorbing Double Negative Medium.

Effective-substrate theory for optical reflection from a layered substrate.

Physical origin of large positive and negative lateral optical beam shifts in prism–waveguide coupling system

Shifting Beams at Normal Incidence Via Controlling Momentum-Space Geometric Phases