Abstract:Normally, Strehl ratio, resolution, and focus depth, the parameters that are used to evaluate the performance of an optical imaging system, are always calculated by scalar diffraction method. Considering the vectorial properties of light, especially when the system numerical aperture (NA) is high, the accuracy of scalar method can no longer fulfill the requirement of analysis. The variations of properties of these parameters accompanied by using of vectorial method are discussed. In order to describe the effects of polarization clearly, assuming a system with identical polarization state within the entrance pupil, by formula deduction and numerical simulation, we conclude that due to the influence of the polarization, the maximum intensity of system diffraction spot decreases, the resolution between image plane and parallel polarized orientation of incident light drops down, then the diffraction spot loses its circular symmetry, the focus depth changes slightly, and these effects becomes more apparent with the increase of system NA. Finally, the method of calculating the off-axis images is discussed in the paper.

Positive and Negative Spatial Dispersion Effects of Optical Thin Films

Enhanced superprism effect based on positive/negative lateral shift of reflective beam in a Fabry-Perot filter.

Spatial Dispersion of Optical Thin Films

Rigorous analysis of the spatial dispersion effect in multilayer thin-film coatings.

Studies on Superprism Effects in Multilayer Thin Film Stacks

Negative Goos-Hanchen Effect in Thin-Film Fabry-Perot Filter

Investigation of Multichannel Spatial Demultiplexer Based on Thickness-Tapered Thin Film Stacks

Superprism effect with a large spatial dispersion and high efficiency in a reflection filter

A study of Electrochromic thin films and Devices by Photothermal Deflection Technique

Large Positive and Negative Lateral Beam Displacement in a Guided-Mode Resonant Filter

Group Delay Dispersion Measurement of a Dispersive Mirror by Spectral Interferometry: Comparison of Different Signal Processing Algorithms.

Measurement of Absolute Phase Shift on Reflection of Thin Films Using White-Light Spectral Interferometry

The Effects of Reflection Phase Shift on the Optical Properties of a Micro-Opto-electro-mechanical System Fabry–Perot Tunable Filter

Superprism Effect in Thin Film Fabry-Perot Filter

The Optical Properties of Periodic Multilayer Thin Films of Negative and Positive Refractive Index Medium

Beam Splitting Phenomena In Fabry-Perot Filter

Large Negative and Positive Lateral Shift on Reflection from a Left-Handed Prism Coated with a Weakly Absorbing Dielectric Film

The Effect of Polarization Light on Optical Imaging System

Negative Goos-Hänchen Shifts with Nano-metal-films on Prism Surface

Two abnormal physical effects in negative index photonic crystals

Spin Displacements of a Gaussian Beam at an Air–multilayer-Film Interface