Developments of X-Ray Grating Imaging Based on Talbot Interferometry
Han Yueping,Chen Zhiqiang,Zhang Li,Huang Zhifeng,Zhang Ran,Jiang Xiaolei,韩跃平 Han Yueping,陈志强 Chen Zhiqiang,张丽 Zhang Li,黄志峰 Huang Zhifeng,张冉 Zhang Ran,姜晓磊 Jiang Xiaolei
DOI: https://doi.org/10.3788/LOP49.070002
2012-01-01
Laser & Optoelectronics Progress
Abstract:We present a review of X-ray grating-based imaging based on interferometry,including the recent developments in instrumentation and methodology.The classic X-ray grating-based imaging based on Talbot-Lau interferometry is introduced in terms of its general principles and system configuration,as well as the multiple information(i.e.,attenuation,refraction and small-angle scattering information) retrieval algorithms.Up-to-date analyses and optimizations of this method are presented,including approaches to relax the high positioning resolution requirement in phase stepping process and attempts on large-field-of-view imaging with high-resolution gratings.Secondly,we introduce the latest developments in two-dimensional grating-based imaging and time-resolved four-dimensional grating-based imaging.An outlook of X-ray grating-based imaging is given.