A New Method of Positron Analysis with Bremsstrahlung-induced X-ray

ZHANG Yi,YANG Yi-gang,LI Yuan-jing,ZHAO Xin-qiang
DOI: https://doi.org/10.3969/j.issn.0258-0934.2011.04.001
2011-01-01
Abstract:Current positron analysis technologies can not measure the defect inside samples because of the small range of positron produced from source outside.A new method of positron analysis,Photon Induced Positron Analysis (PIPA) is showed to solve the problem.When irradiating samples with Bremsstrahlung - induced X -ray based on LINAC,pair production takes place inside the material.Analyzing the annihilation photons helps reveal the information of micro - structure in the samples.Several issues of this method is studied quantitively by simulation with MCNP,like sensitivity and shielding parameters.As well,an experimental system is set up to measure the spectra shape of 511 keVγprecisely.With the analysis result of 511 keV full peak,the relationship between defect concentration and PIPA result is appreciable.
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