Research on Verification Device of Electrostatic Charge Decay Test Apparatus

Long ZHANG,Guang-hui WEI,Qing-hai ZHANG
DOI: https://doi.org/10.3969/j.issn.1674-5795.2007.01.006
2007-01-01
Abstract:In order to trace to the source of electrostatic charge decay test apparatus,a verification device is developed.The device consists of double exponential standard decay voltage source,standard impulse voltage divider and computer data acquiring and processing system in which LabWindows/CVI software is used.The total extended uncertainty degree is 0.66%.
What problem does this paper attempt to address?