Microstructure and Magnetic Properties of Ag/FePt Double Layer Films with Different Cooling Processes

Kai-feng Dong,Xiao-fei Yang,Jun-bing Yan,Wei-ming Cheng,Xiao-min Cheng,Xiang-shui Miao,Xiao-hong Xu,Fang Wang
DOI: https://doi.org/10.1016/j.jallcom.2008.09.098
IF: 6.2
2008-01-01
Journal of Alloys and Compounds
Abstract:Ag/FePt double layer films with different Ag thicknesses were deposited on Corning glass substrates by RF magnetron sputtering and L10-FePt films were prepared after the as-deposited samples were subjected to vacuum annealing with different cooling processes. Experimental results show that the thickness of the Ag layer is a very important factor in preparing the film with a high perpendicular anisotropy. The 40nm Ag/15nm FePt film exhibits a high perpendicular coercivity of 9053Oe and a low in-plane coercivity of 6059Oe. The Ag/FePt double layer films with natural cooling have larger Mr/Ms values than those with fast cooling processes. The angular dependence of the coercivity profile for the FePt film with a thickness of 15nm shows a typical domain wall motion behavior, while both the simulated curve of FePt film of 15nm and the one of 40nm Ag/15nm FePt double layer film revealed the rotation mode, which indicates that the grains are weakly coupled and their reversals of magnetizations are independent in the 40nm Ag/15nm FePt film.
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