A Non-Contact Linear CCD Measuring System Based on FPGA and ADSP

葛鹏,刘涛,李奇
DOI: https://doi.org/10.3969/j.issn.1005-5630.2008.05.001
2008-01-01
Abstract:A non-contact linear CCD measuring system based on FPGA and ADSP technology is proposed.The system utilizes linear CCD as the signal acquisition frontend.FPGA provides time sequences such as CCD working sequences,A/D conversion timing and synchronized timing for ADSP to collect data.Multiple sampling and averaging methods are used to produce one-dimensional digital photographs in virtue of DSP′s high-speed performance and high-performance of float threshold binaryzation algorithms.The simulation timing chart,and the signal′s oscillograph trace of the survey object are given out.The simulation timing satisfies system′s need.Finally through the calibration for the optical system the object′s length is achieved.The experimental data indicates that the measuring system has high speed and high precision performance.
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