Atomic Force Microscopy Studies on Duplex Microstructures of Nanocrystalline-Amorphous in Zr-Based Metallic Glass

T Benameur,K Gammoudi,AR Yavari,A Inoue
DOI: https://doi.org/10.4028/www.scientific.net/jmnm.24-25.479
2000-01-01
Materials Science Forum
Abstract:An atomic force microscopy (AFM) has been used so that it measures atomic scale forces as result of interaction between surfaces in relative motion. The sliding of a silicon nitride tip on amorphous, duplex nanocrystalline-amorphous and crystalline states of Zr60Ni10Cu20Al10 alloy shows different frictional behaviors. We have observed lower values of friction for the amorphous state at low load regime. Furthermore, the friction is seen to change in a step-wise fashion probably resulting from a sequence of structural transitions of the contact involving elastic and yielding stages. No evidence for a presence of extended damage in the recorded in-situ friction images at different scan sizes which is a clear indication of an elastic behavior during frictional sliding. Comparison between frictional data and that predicted based on the Derjaguin, Muller and Toporov (DMT) model for the three states of Zr60Ni10Cu20Al10 alloy is developed.
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