A Method to Estimate the Junction Temperature of Photodetectors Operating at High Photocurrent

Hao Chen,Andreas Beling,Huapu Pan,Joe C. Campbell
DOI: https://doi.org/10.1109/jqe.2009.2023609
IF: 2.5
2009-01-01
IEEE Journal of Quantum Electronics
Abstract:A method to estimate the junction temperature while operating at high photocurrent levels is presented. The relative responsivity change is measured at high operating current. Using a model for the temperature-dependence of the bandgap, a relation between the relative change in the output power and the internal junction temperature is derived. Good agreement between experimental data and simulations is achieved.
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