Preparation and characterization of semiconductor-organic films with a mesolamellar structure

Ni Bai,Haiyong Chen,Jiesheng Chen,Yunling Liu,Yanghong Guo,Dongmei Li,Wenqin Pang
DOI: https://doi.org/10.1016/S0167-577X(01)00359-7
IF: 3
2002-01-01
Materials Letters
Abstract:Semiconductor-organic composite films built up of titania and surfactants (e.g. C16TAB, C14TAB, C12TAB) have been prepared on glass substrates at 50°C in air and under hydrothermal conditions, respectively. XRD, SEM, TEM and UV-VIS diffuse reflectance spectra studies indicate that a lamellar mesostructure with d spacing of 34 Å is obtained and the thickness of the titania layer intercalated between organic layers is less than 1 nm.
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