Optimizing the Lighting in Automatic Inspection System Using Monte Carlo Method

L Chen,XS Wang,M Suzuki,N Yoshimura
DOI: https://doi.org/10.1143/jjap.38.6123
IF: 1.5
1999-01-01
Japanese Journal of Applied Physics
Abstract:The lighting affects the cost, stability and quality of image formation in an inspection system. The inspection results are simultaneously affected by such as the light configuration, the reflectance of the inspected object, and the performance of lens, therefore it is difficult to supply the resolution either by measuring or analytical methods. The illumination effect of two different light sources in an automatic inspection system is studied by means of Monte Carlo (MC) method in this paper. The theoretical analysis and simulation results reveal as follows: It is possible to examine the performance of the different light sources and the reflection characteristics of the inspected object in an automatic inspection system by MC simulation method. When the size and the surface roughness of the inspected object vary, the collection result of lens under a desired annular light source has a better effect than under a sloped planar light source. However, with the reflector depth of the annular fluorescent lamp increasing, the efficiency decreases. This research not Only supplies an available method for the analysis of light configuration but also points out a new way for light source selection in an automatic inspection system.
What problem does this paper attempt to address?