Temperature Dependent X-ray Diffraction Study on Gd5Sn4 Compound

HF Yang,GH Rao,GY Liu,ZW Ouyang,WF Liu,XM Feng,WG Chu,JK Liang

DOI: https://doi.org/10.1016/j.jallcom.2003.08.093

2004-01-01

ChemInform

Abstract:The structure and the magnetic properties of the Gd5Sn4 compound have been investigated by means of X-ray diffraction (XRD) and magnetization measurements. Temperature dependent XRD investigation reveals that there is no structural transition around the temperature at which the first-order magnetic transition occurs in this compound, i.e. the compound retains the Sm5Ge4-type structure from 80 K(TC), which is different from the Gd5(Si, Ge)4 system. Based on the Rietveld refinement of the XRD pattern of Gd5Sn4 compound, we show that the unit cell volume exhibits a dip near the Curie temperature, i.e. a negative coefficient of thermal expansion α≈−1.5×10−4 K−1 from 82 to 90 K and a positive coefficient α≈2.2×10−4 K−1 from 90 to 98 K. The coefficient of thermal expansion from 98 to 298 K is only 2.5×10−5 K−1.