Abstract:An accurate description of the electromagnetic properties of materials is fundamental to optical and electric devices. As a current research hotspot, thin slabs generally are modeled as a film of finite thickness with a dielectric function. However, inspired by two-dimensional materials, thin slabs can be regarded as surface current sheets with conductivity. Due to the convenience of the latter in simplifying the calculations, it becomes increasingly significant to determine the equivalent conditions of the two models. In this work, we compare the differences between the thin film and surface current models in calculating the transmissivity, reflectivity, and absorptivity of a SiC film. For normal incidence, the difference between the calculations of the two models is only non-negligible when the thickness is large (500 nm), because of the invalidation of surface current models and the excitation of Fabry-Perot resonance. In particular, we derive analytical formulas for the relative error in transmittance versus phase difference, which can be used to predict the difference between the two models as a function of film thickness. For oblique incidence, the two models have significant differences in the vicinity of epsilon-near-zero (ENZ) frequency. The excitation of the Berreman leaky mode in a thin film model causes a narrow blank absorption peak close to the ENZ frequency. However, we found that the surface current model is unable to form this resonance mode and further demonstrate it theoretically. In addition, it is found that the two models are equivalent in the case of a transverse electric wave even though the incidence is oblique. This work can enhance the awareness of the light-matter interaction and open unprecedented avenues for designing ultrathin optical devices.

Three-dimensional analyses of photo-modulated reflectivity for transparent film/opaque substrate structures.

Theoretical and Experimental Study of Photo-Modulated Reflectivity Detections for Transparent Film/opaque Substrate Structures

Numerical Analysis of Thermal Response of Mid-Infrared High Reflectance Coating under Different Laser Irradiation Angles

Study on the property of subwavelength imaging in a metal thin-film structure

Laser-induced Heating of Mid-Infrared High Reflectance Coatings

Transient Thermal Grating Measurements and FEM Calculations of Thermoelastic Theory for Characterizing Multilayered Thin Films

Light Transmission in Thermal Stress-Induced Birefringent Medium

Modulation of the Time-Domain Reflectance Signal Induced by Thermal Transport and Acoustic Waves in Multilayered Structure

Thermal Diffusivity of Film/Substrate Structures Characterized by Transient Thermal Grating Method

Beam Expansion in Thermo-Optic-effect-induced Total Internal Reflection and Its Applications in Optical Switches.

Three-dimensional Theory to Study Photothermal Phenomena of Semiconductors. I. Modulated Optical Reflectance

The Effect of Interface Resistances on Thermal Wave Propagation in Multi-Layered Samples

Modeling for Laser-Induced Surface Thermal Lens in Semiconductors

Design, preparation, and property analysis of metal/dielectric multilayer film with wavelength selectivity

Comparative analysis of two models for the optical response of a thin slab: a film of finite thickness versus a surface current sheet

Time-Resolved Reflectivity Evolution of Transparent Dielectrics under Femtosecond-Laser Pulse Excitation

Transient and Steady-State Temperature Rise in Three-Dimensional Anisotropic Layered Structures in Pump-Probe Thermoreflectance Experiments

Experimental Study on Coherence of Thermal Radiation of Thin Film Structures

General Theory Of Optical Reflection From A Thin Film On A Solid And Its Application To Heteroepitaxy

Two-Dimensional Transient Thermal Analysis of Diamond/Si Structures Heated by A Pulsed Circular Gaussian Laser Beam

Modeling and Admittance Recursive Simulation of Anti-Reflective Coatings for Photothermal Conversion: Synergy between Subwavelength Structures and Gradient Refractive Index Layer