Analysis of transient temperature field and thermal stress of internal thermal shield for EAST during cooling down

Zhu Yanyun,Zhuang Ming,Wang Xuemin,Xu Guangfu,Zhou Zhiwei
DOI: https://doi.org/10.3969/j.issn.1000-6516.2010.02.009
IF: 2.134
2010-01-01
Cryogenics
Abstract:Based on the security of internal thermal shield during cooling down of EAST,the rationality of 50 K temperature difference was verified.The temperature field,thermal stress and total stress were calculated with ANSYS software while flowing gaseous helium was at 50 K temperature difference between import and export during cooling down.The calculated results demonstrate existing control parameters are rational.
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