Preparation and Characterization of Nanocrystalline Gd2sio5 : Ce

ZM Qi,CS Shi,GB Zhang,ZF Han,HH Hung
DOI: https://doi.org/10.1002/pssa.200305922
2003-01-01
Abstract:A 2% Gd2SiO5:Ce nanocrystalline sample was prepared by the sol-gel method at 1200 degreesC, which is much lower than the usual calcination temperature of the solid-state reaction method. The sample was studied by X-ray diffraction, extended X-ray absorption fine structure spectroscopy (EXAFS) and photoluminescence spectroscopy. The crystal structure is of the monoclinic phase and the crystallite size is 22 nm. X-ray absorption near-edge structure (XANES) spectroscopy of the Ce-L-III, edge indicates that the Cc ion in Gd2SiO5:Ce has a +3 valence state. EXAFS shows that the coordination numbers of the Gd-O and Ce-O shells are 8.3 and 7.7, respectively. The bond lengths of the Gd-O and Ce-O shells are 2.46 and 2.32 Angstrom, respectively. This suggests that Ce3+ has entered the Gd2SiO5 lattice and substituted Gd3+ in two sites. The emission and excitation spectra show similar features to the bulk sample except for a small shift.
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