Abstract:Probe is a key part of atomic force microscopy (AFM) and the curvature radius of its tip limits the lateral resolution. Furthermore, as an expendable, its life has a direct effect on operation cost. Single-walled carbon nanotubes (SWNTs) are ideal materials for the probe tips used in atomic force microscopy (AFM), since they have intrinsically small diameters, high aspect ratios and unique wearability. Herein, the fabrication of AFM SWNT tips is systemically investigated, including mechanical method and direct growth method. In the former, substrates with isolated SWNTs are first prepared by chemical vapor deposition and then scanned with conventional silicon probes under AFM. During scanning, SWNTs can be picked up from substrates and attached to the pyramid of silicon probes via attractive Van del Waals forces. Preparation of substrates is decisive to this method, since only the SWNTs disengaged from surface are possible to pick up. Different substrates have been compared and the results show that the substrates full of gaps are prior to the planar ones. SWNTs are suspended across gaps and suitable to the following assembly. The mechanical method is easily implemented and can produce AFM SWNT tips one by one, while the direct growth method is promising to manufacture them in a large scale, in spite of more difficulty. In the latter, catalyst for the growth of SWNTs is directly placed on individual commercial probes or pyramid arrays. Through chemical vapor deposition, grown SWNTs protrude from the original tips and create new ones. Due to the random orientation of SWNT growth, the yield of successful SWNT tips is generally low for the direct growth method. In this article, Electric filed is used to direct the growth orientation of SWNTs during chemical vapor deposition. Both electrodes are located in the furnace to apply a static electric field along the pyramid axis during growth. The intensity can be varied from 0.1V/um to IV/um, and the direction is towards the surface of wafers. The growth of SWNTs is oriented by electric field and the yield of SWNT tips is raised. The AFM SWNT tips derived from the above two methods have been utilized to image Au layers in the tapping mode. Compared with conventional silicon probes, SWNT tips are longer lasting to keep a high resolution.

Wear-Resistance Comparison of Carbon Nanotubes and Conventional Silicon-Probes for Atomic Force Microscopy

Rebirth Of Worn Atomic Force Microscopy Silicon Tips

Amplitude Response of Multiwalled Carbon Nanotube Probe with Controlled Length During Tapping Mode Atomic Force Microscopy

Experimental Investigation of Tip Wear of AFM Monocrystalline Silicon Probes

On the Applicability of Carbon Nanotubes As Nanomechanical Probes and Manipulators.

Fabrication of AFM Single-Walled Carbon Nanotube Tips

IMAGING BIOLOGY SAMPLE AT HIGH RESOLUTION WITH CARBON NANOTUBE AFM PROBE

Controlled Growth of a Single Carbon Nanotube on an AFM Probe

Effects of Tip-Nanotube Interactions on Atomic Force Microscopy Imaging of Carbon Nanotubes

Research of the Atomic Force Microscopy Profilometer System

High-reliability graphene-wrapped nanoprobes for scanning probe microscopy

Characterization of the Resistance and Force of a Carbon Nanotube/Metal Side Contact by Nanomanipulation

Direct Measurement of Plowing Friction and Wear of a Polymer Thin Film Using the Atomic Force Microscope

SYNTHESIS AND THE PERFORMANCE OF CARBON NANOTUBES-(Ni-P) COMPOSITES

Adhesion, Friction and Wear on the Nanoscale of Mwnt Tips and Swnt and Mwnt Arrays

Quantitative wear evaluation of tips based on sharp structures

Why Can the Carbon Nanotube Tips Increase Resolution and Quality of Image in Biological Systems?

Development of a New Microscopic Four-Point AFM Probe for the Measurement of Local Electrical Conductivity

Simulation of CNT-AFM tip based on finite element analysis for targeted probe of the biological cell

Sharp-Tip Silver Nanowires Mounted on Cantilevers for High-Aspect-Ratio High-Resolution Imaging.

Nanowear pretreatment of AFM tips for reasonable friction force