Abstract:Magnetoelectric bilayered Pb(Zr0.52Ti0.48)O3-CoFe2O4(PZT-CFO) films with different PZT thicknesses were grown on (111)Pt/Ti/SiO2/Si substrates using chemical solution spin-coating. Structural characterization by X-ray diffraction and electron microscopy shows pure phases and well-defined interfaces between the PZT and CFO films. The CFO-PZT-substrate structure effectively alleviates the substrate clamping effect for the CFO layer, showing appreciable magnetoelectric responses in the composite films. Both the direct magnetoelectric effect and the magnetic field-induced Raman shifts in the A1(TO1) soft mode of PZT demonstrate the magnetic-mechanical-electric coupling in the films. The results also indicate that with a constant CFO layer thickness, the thickness of the PZT layer plays an important role in the stress relaxation and strong magnetoelectric coupling. The coupling could be further enhanced by increasing the CFO thickness, optimizing the volume (thickness) fraction of the PZT thickness, and releasing the clamping effect from the substrate.

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