Abstract:Electron beam probe (EBP) is a new principle detector, which makes use of a low-intensity and low-energy electron beam to measure the transverse profile, bunch shape, beam neutralization and beam wake field of an intense beam with small dimensions. While can be applied to many aspects, we limit our analysis to beam distribution reconstruction. This kind of detector is almost non-interceptive for all of the beam and does not disturb the machine environment. In this paper, we present the theoretical aspects behind this technique for beam distribution measurement and some simulation results of the detector involved. First, a method to obtain parallel electron beam is introduced and a simulation code is developed. And then, EBP as a profile monitor for dense beam is simulated using fast scan method under various target beam profile, such as KV distribution, waterbag distribution, parabolic distribution, Gaussian distribution and halo distribution. Profile reconstruction from the deflected electron beam trajectory is implemented and compared with the actual one, and an expected agreement is achieved. Furthermore, Instead of fast scan, a slow scan, i.e. step-by-step scan, is considered, which lows the requirement for hardware, i.e. Radio Frequency deflector. we calculate the three dimensional electric field of Gaussian distribution and simulate the electron motion under this field. In addition, fast scan along the target beam direction and slow scan across the beam is also presented, and can provide a measurement of longitudinal distribution as well as transverse profile simultaneously. Final, simulation results for China Accelerator Driven Sub-critical System (CADS) and High Intensity Heavy Ion Accelerator Facility (HIAF) are given to investigate the quantitative behavior of EBP.

Electron Beam Characterizations With Optical Diffraction Radiation From Circular Aperture And Rectangular Slit

Properties of Diffraction Radiation in Practical Conditions: Finite Size Target Effect, Surface Roughness and Pre-Wave Zone

Multiple Parameter Characterizations for Electron Beam with Diffraction Radiation

Diffraction Radiation And Its Applications In Electron Beam Diagnostics

Wake of a Beam Passing Through a Diffraction Radiation Target

Imaging of High-Energy Electron Beam Profile with Optical Diffraction Radiation

Ultrashort Electron Bunch Length Measurement with Diffraction Radiation Deflector

Full-aperture Long Focal-Length Measurement Based on Divergent Beam

Experimental Characterization of Sub-picosecond Electron Bunch Length with Coherent Diffraction Radiation

High Energy Electron Radiography System Design and Simulation Study of Beam Angle-Position Correlation and Aperture Effect on the Images

Optical Circular Deflector with Attosecond Resolution for Ultrashort Electron Beam

Simulation study of electron beam divergence and its distribution measurement

Theoretical Considerations on Imaging of Micron Size Electron Beam with Optical Transition Radiation

Dielectronic recombination studies based on EBIT

Beam distribution reconstruction simulation for electron beam probe

Time-resolved electron beam diagnostics with sub-femtosecond resolution

A PROPOSAL FOR THE MEASUREMENT OF THE REAL EMITTANCE OF THE BEAM IN CYCLIC ACCELERATORS

Research of Optical Transition Radiation on Intense Electron-Beam Diagnostics

A New Measurement Of Electron Beam Emittance With Cerenkov Radiation "Double Imaging" Method

Dual degrees of freedom diagnosis with high energy electron lens radiography

Conditional guided generative diffusion for particle accelerator beam diagnostics