Abstract:3D atomic force microscope images of Ni thin film, Minkowski connectivity, and graphical of multifractal f(α). The absorption spectrum of the Ni thin film deposited on different metal substrates. As the first boundary between the environment and the material, the surface plays an important role in their interaction with each other, therefore, the use of appropriate tools and analysis to examine the mechanical properties and morphology of surfaces has particular importance in industry and research. In this research, a thin film of nickel was deposited on metal substrates made of aluminum, copper, and steel by using the RF magnetic cathode. Then, using a non‐contact atomic force microscope, the morphological properties of the nickel film with static parameters, Minkowski functionals (MF's), fractal, and multifractal were extracted to be analyzed and studied. After that, using parameters such as root mean square (RMS) roughness, skewness, and kurtosis, it was determined how the surface roughness, distribution, and probability density of particles on the film surface alters with the change of the substrate. Next, by examining and analyzing the Δα and Δf parameters obtained from the multifractal section, the morphology of the produced film on the metal substrates was investigated. Then, the change in the surface plasmon resonance (SPR) peak position is changed for the prepared film in the range of the absorption spectrum due to the substrate effect and the microstructural properties of the formed film. Highlights Ni film has been deposited by Rf magnetron sputtering. The effect of metal substrates on the topography, fractality, and optical properties was studied. Minkowski functionals were used to investigate the surface morphology of the samples. Substrate's material and the topography of the formed film can changed the surface plasmon resonance position.

The study of the optical properties of obliquely evaporated nickel films using IR surface plasmons

Anisotropic Optical Constants Of In-Plane Oriented Polyfluorene Thin Films On Rubbed Substrate

Infrared Surface Plasmon-polaritons on Ni, Pd and Pt

Permittivity Acquisition Of Plasmonic Materials At Epsilon Near Zero Wavelengths

Preparation and Properties of NiO Films Via Sol-gel Process and Spin-coating

In Situ Optical Characterizations of the Annealing Effects Upon Sno2: F Films by Spectroscopic Ellipsometry

Study of Annealing Effects Upon the Optical and Electrical Properties of SnO2:F/SiCxOy Low Emissivity Coatings by Spectroscopic Ellipsometry

Linearization and characterization of the Wemple – DiDomenico model of ZnO/Ni/ZnO tri-layer thin films prepared by ALD and DC magnetron sputtering

Investigation of microstructural, micromorphology, and surface plasmon resonance characteristics in Ni/Al, Ni/Cu, and Ni/SS thin films

Structural Origins of Optical Properties of Nanosized Indium Particle Films: an Ellipsometric Insight

Characterization of highly anisotropic three-dimensionally nanostructured surfaces

Structural and optical properties on nickel oxide thin films prepared by simple nebulizer spray technique

Experimental Observation of Thermo-optic Nonlinearity with a Long-range Surface Wave Supported by a Very Thin Palladium Film

Realistic Silver Optical Constants for Plasmonics

Characterizations of Nickel Oxide Thin Films Prepared by Reactive Radio Frequency Magnetron Sputtering

The Medium-Related Optical Constants of Noble Metals Observed by Ellipsometric Study

Influence of Optical Nonlinearity on Surface Plasmon Resonance

Third-order non-linear optical switching and threshold limiting of NiO thin films

Investigation on tailoring physical properties of Nickel Oxide thin films grown by dc magnetron sputtering

Study of Reactively Sputtered Nickel Nitride Thin Films

Measurement of Refractive-Indexes and Study of Isotropic-Nematic Phase-Transition by the Surface-Plasmon Technique