Characterization of A Metal-Clad Anisotropic Thin-Film by the Guided-Wave Method

HM WANG
DOI: https://doi.org/10.1080/09500349414551881
IF: 1.3
1994-01-01
Journal of Modern Optics
Abstract:We have studied the propagation of plane waves in anisotropic and absorbing films. The Goos-Hanchen shifts at interfaces of film/metallic overlayer and film/substrate as well as the transverse phase shift of the plane wave travelling in the films have been determined. Based on these studies, the refractive indices and thicknesses of films have been recovered from theoretical analyses and experimental investigations on the mode dispersion equation of guided waves in the films.
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