Transmission electron microscope in-situ observations of twinning in the lamellar microstructure in a TiAl based alloy

X.K. Meng,Z.G. Liu
DOI: https://doi.org/10.1016/0167-577X(95)00185-9
IF: 3
1995-01-01
Materials Letters
Abstract:The process of tensile deformation of the two-phase lamellar γ(L10)α2(DO19) microstructure in a TiAl based alloy was investigated by in-situ transmission electron microscopy. The strain contrast in “soft” α2 lamella and twinning in “hard” γ lamella are observed when the lamellar structure is loaded. It is suggested that the relaxation of the twinning strain by α2 plays an important role in ductility improvement of the lamellar structure and the twinning is an important deformation mechanism in the two-phase TiAl alloys.
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