A Method for Surface Defects Detection in Kiwi Fruit Classification

Cui Yongjie,Li Pingping,Ding Xian,Su Shuai
DOI: https://doi.org/10.3969/j.issn.1003-188X.2012.10.035
2012-01-01
Abstract:Kiwi surface defects detecting is the most complex,time-consuming in automation and classification.Kiwi fruit surface defect include rotten,scratch and burning,inspection process includes two stages: the defect segmentation and the defect recognition.This paper put forward that kiwi machine vision collection system use the near-infrared light source to get images,and use the median filtering method to eliminate process all kinds of noise of original images;image segmentation get the black spot area of kiwi fruit surface,including the real defect area and fruit calyx area.The experiments indicate that the near infrared light sources can effectively extract kiwi fruit rotten,scratch and burning,and near-infrared light source images effectively avoid the traditional images reflected the light spot area.In the defect segmentation how to correctly identify suspicious defect area,utilizing double pyramid data form of the box counting dimension fast calculation method,put forward the characteristics parameters of describing the regional roughness and texture of the directional,the parameters of the extraction have a little effect by changing light intensity change and fruit position,we can be based on the parameters to distinguish between defects and fruit calyx area.
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