Abstract:For a century, x-ray crystallography has been conducted with one of the two extreme sample conditions: either a single crystal which produces a single set of diffraction spots directly corresponding to the geometric orientation of the crystal, or a powder sample which comprises a huge number of crystals so numerous that the diffraction spots overlap and merge into smooth rings while the geometric relation is completely lost and only the d-spacings information of diffraction planes is observed. High-pressure DAC is not optimized for either condition. Powder x-ray diffraction has the intrinsic limitations when the sample consists of multiple different phases with low symmetry. Diffraction rings cover most of the detector area, and only a couple of low angle diffraction rings are unique to a phase; most other rings overlap with one another and cannot be used for unique identiﬁcation or accurate determination of crystallographic parameters. New structures and minor phases are often overshadowed by the diffraction of major phases and are impossible to ﬁnd or identify. Advanced crystallographic software, such as Rietveld and LeBail reﬁnement methods, may get most out of a powder pattern, but cannot overcome the intrinsic limitations. In addition, the common practice of integrating the 2D ring into a 1D peak plot throws away the valuable information of a whole dimension, such as the azimuthal angle of diffraction spot around the ring. Single-crystal XRD contains orientation and geometrical relationship in addition to d-spacings and thus provides a deﬁnitive characterization of the unit cell and symmetry. Unless the crystal is orientated exactly relative to the incident monochromatic x-ray beam to satisfy the Bragg relation, the crystal gives no signal, and the detector remains empty. Rotating the crystal around the w-axis (perpendicular to the incident x-ray beam) can bring the crystal to Bragg condition and occasionally obtain single diffraction spots at a given angle and scanning step. In spite of the advantages, single crystal cannot be sustained through phase transitions and often breaks down into multiple crystals and generate spotty XRD patterns. Spottiness, that is generally regarded as a ﬂaw in powder XRD, can be turned into great advantages if we can separate individual crystallites and handle them as individual single crystals. The high-brilliance x-ray beam available at synchrotron facilities has made it possible to collect diffraction spots in a powder sample comprised of up to hundreds of submicron crystallites. The newly developed Multigrain Crystallography (MGC) package, which is a suite of programs used for processing and indexing diffraction spots, has been developed to separate and identify the crystallographic orientation of each individual crystallite in the aggregate of hundreds of crystallites. Once separated, the data set for each crystallite can be handled with the standard single-crystal reﬁnement program identical to a stand-alone single crystal, resulting in excellent statistics in reﬁnement and full coverage of the reciprocal space. The MGC method is very powerful in unequivocal determination of symmetry and unit cells, testing different indexing models, picking out minor phases, and resolving strain of individual crystallites, and will very likely replace the powder and single-crystal x-ray diffraction methods as the dominant crystallographic tool for future high pressure-temperature studies in DAC.

Density measurement of samples under high pressure using synchrotron microtomography and diamond anvil cell techniques.

A Scanning Angle Energy-Dispersive X-Ray Diffraction Technique for High-Pressure Structure Studies in Diamond Anvil Cells

Accurate Temperature Measurement by Temperature Field Analysis in Diamond Anvil Cell for Thermal Transport Study of Matter under High Pressures

High-pressure fluorescence measurements using a diamond anvil cell (DAC)

High-Pressure Synchrotron X-Ray Spectroscopy With Diamond Anvil Cells

The Study of Noncrystalline Material under High Pressure Using High Energy X-Ray Pair Distribution Function Combined with Synchrotron X-Ray Microtomography Techniques

A Focusing System for X-ray Diffraction Studies of Materials under High Pressure in the Diamond Cell

In Situ Thermal Conductivity Measurement in Diamond Anvil Cell

Use of a confocal optical device for centring a diamond anvil cell in single‐crystal X‐ray diffraction experiments

Investigating the Thermal Conductivity of Materials by Analyzing the Temperature Distribution in Diamond Anvils Cell under High Pressure

Energy dispersive x-ray diffraction of micro-crystals at ultrahigh pressures

The Application of Synchrotron Radiation in the Research of Mineral Structure under High Pressure

The moissanite anvil cell: a new tool for high-pressure research

The Revolutionary Multigrain Crystallography Method for High-Pressure X-ray Diffraction

Laser heating setup for diamond anvil cells for in situ synchrotron and in house high and ultra-high pressure studies

A miniature multi-anvil apparatus using diamond as anvils—MDAC: Multi-axis diamond anvil cell

In-situ High Pressure Nuclear Magnetic Resonance Crystallography

Parallel background subtraction in diamond anvil cells for high pressure X-ray data analysis

Thickness measurement of sample in diamond anvil cell

Suppression of Bragg Reflection Glitches of a Single-Crystal Diamond Anvil Cell by a Polycapillary Half-Lens in High-Pressure XAFS Spectroscopy.

Effect of Deformation of Diamond Anvil and Sample in Diamond Anvil Cell on the Thermal Conductivity Measurement*