Effect of a trace of Cr on intermetallic compound layer for tin–zinc lead-free solder joint during aging

Xi Chen,Anmin Hu,Ming Li,Dali Mao
DOI: https://doi.org/10.1016/j.jallcom.2008.02.112
IF: 6.2
2009-01-01
Journal of Alloys and Compounds
Abstract:Influence of Cr on growth of interfacial intermetallic compound (IMC) at the interface of Sn–9Zn/Cu substrate during aging at 85°C/20%RH and 85°C/85%RH for 500h has been investigated. After aging treatment, IMC layer at the Sn–9Zn/Cu joint is much thicker than that at the Sn–9Zn–Cr/Cu joint. Estimation according to experimental data presents that IMC growth rate of Sn–9Zn–Cr/Cu interface is about 70–75% lower than that of Sn–9Zn/Cu interface.
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