PIXE analysis of the Mn-doped content in Ga<sub>1-x</sub>Mn<sub>x</sub>N film grown by LP-MOVPE

B. Zhang,S. D. Yao,K. Wang,D. B. Ding,Beijing P.R. China Beijing P.R. China,Beijing P.R. Beijing P.R. C,Beijing Beijing,Beijing Beijing,Bei Beij
DOI: https://doi.org/10.1007/s10967-006-0224-4
2006-01-01
Journal of Radioanalytical and Nuclear Chemistry
Abstract:PIXE was used for the non-destructive analysis of Ga1-xMnxN film grown by LP-MOVPE. Compared with RBS, PIXE could detect the microelement Mn in these films and also determine the absolute Mn-doped quantity accurately. It is very powerful tool to analyze the microelement-doped in the Ga1-xMnxN films non-destructively. Subsequently the magnetic property was measured by the Quantum Design MPMS SQUID magnetometer. The ferromagnetism of these Ga1-xMnxN films was presented at or above room temperature. The experimental results showed that the Mn-doped content and the annealing treatment could affect the ferromagnetism.
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