The preferential alignment of negatively and neutrally charged A-centers in silicon under 〈100〉 uniaxial stress

Qin Guo-Gang,Yao Xiu-Chen,Mou Jian-Xun
DOI: https://doi.org/10.1016/0038-1098(85)90741-0
IF: 1.934
1985-01-01
Solid State Communications
Abstract:It has been shown that pure neutrally and negatively charged A -centers could be studied with uniaxial stressed DLTS method. The 〈100〉 stress-induced energy differences between nonequivalent orientations of neutral and negative A -centers and electron energy difference between nonequivalent orientations of A -center have been measured separately.
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