Modeling Reverse Short Channel and Narrow Width Effects in Small Size MOSFET's for Circuit Simulation

YH Cheng,T Sugii,K Chen,CM Hu
DOI: https://doi.org/10.1109/sispad.1997.621384
IF: 1.916
1997-01-01
Solid-State Electronics
Abstract:Modeling of small size MOSFETs and experimental verification of the model using devices with varying pocket implant processes are presented. The results show that the model can describe reverse short channel and narrow width effects and match the measured characteristics of threshold voltage and saturation current over a wide range of channel lengths and widths down to 0.12 /spl mu/m regime.
What problem does this paper attempt to address?