Abstract:Photoemission driven by a strong electric field of near-infrared or visible light, referred to as strong-field photoemission, produces attosecond electron pulses that are synchronized to the waveform of the incident light, and this principle lies at the heart of current attosecond technologies. However, full access to strong-field photoemission regimes at near-infrared wavelengths based on solid-state materials is restricted by space-charge screening and material damage at high optical-field strengths, which significantly hampers the realization of predicted attosecond technologies, such as ultra-sensitive optical phase modulation. Here, we demonstrate a new type of strong-field photoemission behaviour with extreme nonlinearity -- photoemission current scales follow a 40th power law of the optical-field strength, making use of sub-nanometric carbon nanotubes and 800 nm pulses. As a result, the total photoemission current depends on the carrier-envelope phase with a greatly improved photoemission current modulation depth of up to 100%, which has not previously been achieved. Time-dependent density functional calculations reveal the completely new behaviour of the optical-field induced tunnelling emission process directly from the valence band of the carbon nanotubes, which is an indication of full access to a strong-field photoemission regime. Furthermore, the nonlinear dynamics are observed to be tunable by changing the binding energy of the valence-band-maximum, as confirmed by Simpleman model calculations. We believe that such extreme nonlinear photoemission from nanotips offers a new means of producing extreme temporal-spatial resolved electron pulses. These results additionally provide a new design philosophy for attosecond electronics and optics by making use of tunable band structures in nanomaterials.

DEVELOPMENT OF NANO-SCALE CHARACTERIZATIN TECHNIQUES BY AUGER ELECTRON SPECTROSCOPY

Surface Patterning for Multi-Scale Strain Analysis of In-Situ Sem Mechanical Experiments

Study of the Raman-Afm System for Simultaneous Measurements of Raman Spectrum and Micro/Nano-Structures

In Situmultiproperty Measurements of Individual Nanomaterials in SEM and Correlation with Their Atomic Structures

Nanoscale Spectroscopic Mapping by Scanning Probe Electron Energy Spectroscopy

In situ comprehensive characterization of optoelectronic nanomaterials for device purposes.

Single-nano-thread in-situ mechanical characteristic detection and structure analysis method and apparatus

Advanced Characterization Methods for Electrical and Sensoric Components and Devices at the Micro and Nano Scales

B13-O-01 High Spatial/Energy Resolution Cathodoluminescence Spectroscopy: Powerful Tool for Precise Characterization of Nanostructures

Apparatus and method for measuring electro-mechanical property and microstructure of nano material in stress condition

Development of Electron Energy-Loss Spectroscopy for Nanoscience.

Quantitative Nanoscale Local Strain Profiling in Embedded Sige Metal-Oxide-Semiconductor Structures

Exploration of Nano-Surface Chemistry for Spectral Analysis

Low-voltage single-atom electron microscopy with carbon-based nanomaterials

In-situ Field Emission Studies of Individual One-Dimensional Nanostructures Based on Scanning Electron Microscope

In-situ manipulating,fabricating and measuring nanostructures inside SEM

Preparation and Structure Characterizations of Nanosized Materials

CHARACTERIZATION AND MANIPULATION OF NANOSTRUCTURES BY A SCANNING TUNNELING MICROSCOPE

In situ fabrication and investigation of nanostructures and nanodevices with a microscope.

Study of electron emission from 1D nanomaterials under super high field

Recent Advances on in Situ SEM Mechanical and Electrical Characterization of Low-Dimensional Nanomaterials.