Spatial-frequency-shift Enables Integrated Super-Resolution Microscopy: Advance and Perspective
Chenlei Pang,Xiaowei Liu,Mingwei Tang,Qing Yang,Xu Liu
DOI: https://doi.org/10.1016/j.scib.2022.04.017
IF: 18.9
2022-01-01
Science Bulletin
Abstract:The invention of the optical microscope is significant to the development of many aspects of science and technology,including novel materials,life sciences and medicine,for its superiorities in resolving fine structures.But,restrained by the Abbe diffraction limit,the best-resolving capability that can be obtained by conven-tional linear optical microscopy is~200 nm laterally and~500 nm axially using an objective lens(numerical aperture=1.4)at 550 nm wavelength.Over the past decades,to break the resolution limit and meet the increasing demand for super-resolution ability,numerous attempts were made,and fruitful developments emerged[1-8].Among all the approaches,one significant class is based on the integrated spatial frequency engineering to extend the collectable spatial frequency region via spatial frequency shift(SFS)method[3-13].Through the combination of SFS with spe-cially designed photonic chips,highly sophisticated optical sys-tems in traditional super-resolution instruments are moved out.