Controlled Micropatterning of a Si(100) Surface by Combined Nitroxide-Mediated and Atom Transfer Radical Polymerizations

F. J. Xu,Y. Song,Z. P. Cheng,X. L. Zhu,C. X. Zhu,E. T. Kang,K. G. Neoh
DOI: https://doi.org/10.1021/ma050581i
IF: 5.5
2005-01-01
Macromolecules
Abstract:ADVERTISEMENT RETURN TO ISSUEPREVCommunication to the...Communication to the EditorNEXTControlled Micropatterning of a Si(100) Surface by Combined Nitroxide-Mediated and Atom Transfer Radical PolymerizationsF. J. Xu, Y. Song, Z. P. Cheng, X. L. Zhu, C. X. Zhu, E. T. Kang, and K. G. NeohView Author Information Department of Chemical and Biomolecular Engineering, National University of Singapore, Kent Ridge, Singapore 119260; Department of Electrical and Computer Engineering, National University of Singapore, Kent Ridge, Singapore 117576; and School of Chemistry and Chemical Engineering, Soochow University, Suzhou, P.R. China 215006 Cite this: Macromolecules 2005, 38, 15, 6254–6258Publication Date (Web):June 22, 2005Publication History Received19 March 2005Revised25 May 2005Published online22 June 2005Published inissue 26 July 2005https://doi.org/10.1021/ma050581iCopyright © 2005 American Chemical SocietyRIGHTS & PERMISSIONSArticle Views636Altmetric-Citations48LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InReddit Read OnlinePDF (379 KB) Get e-AlertscloseSUBJECTS:Layers,Radical polymerization,Silicon,Thickness,X-ray photoelectron spectroscopy Get e-Alerts
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