Disassociation of Excitons in MEH-PPV Layer under High Electric Field Based on Solid-State Cathodoluminescence (SSCL) Structure

Qian Lei,Liu Wei,Bera Debasis,Teng Feng,Yang Sheng-Yi,Hou Yan-Bing,Xu
DOI: https://doi.org/10.1016/j.physb.2007.09.095
IF: 2.988
2007-01-01
Physica B Condensed Matter
Abstract:By using the Franz–Keldysh model, the disassociation probability of poly[2-methoxy-5-(2′-ethylhexyloxy)-1,4-phenylene vinylene] (MEH-PPV) excitons within the ordinary field strength range was calculated based on solid-state cathodoluminescence (SSCL) structure. It can be inferred that the disassociation probability of MEH-PPV excitons increases with increasing the applied voltage and it becomes more favorable to blue emission with higher applied voltage.
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