Manipulation and Decoherence of Acceptor States in Silicon

Y. P. Song,B. Golding
DOI: https://doi.org/10.1209/0295-5075/95/47004
2011-01-01
EPL (Europhysics Letters)
Abstract:Dielectric constant and absorption measurements on boron-doped silicon samples show that transitions between the acceptor energy levels can be induced by an applied resonant AC electric field and the Stark tuning of level spacing with an external DC electric field. The relatively longer decoherence times, T-2 = 2.6 mu s and T-1 = 7.4 mu s, were observed by the electric echo measurement in a low boron dopant concentration Si sample (8 x 10(-12) cm(-3)). The scalable acceptor-based system is a promising candidate of the charge qubit for quantum computing. Copyright (C) EPLA, 2011
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