Dynamic critical phenomena in two-dimensional fully frustrated Coulomb gas model with disorder

W ZHANG,M LUO
DOI: https://doi.org/10.1016/j.physleta.2008.04.061
IF: 2.707
2008-01-01
Physics Letters A
Abstract:The dynamic critical phenomena near depinning transition in two-dimensional fully frustrated square lattice Coulomb gas model with disorders was studied using Monte Carlo technique. The ground state of the model system with disorder σ=0.3 is a disordered state. The dependence of charge current density J on electric field E was investigated at low temperatures. The nonlinear J–E behavior near critical depinning field can be described by a scaling function proposed for three-dimensional flux line system [M.B. Luo, X. Hu, Phys. Rev. Lett. 98 (2007) 267002]. We evaluated critical exponents and found an Arrhenius creep motion for field region Ec/2<E<Ec. The scaling law of the depinning transition is also obtained from the scaling function.
What problem does this paper attempt to address?