In Situ X-ray Diffraction Study on the Orientation-Dependent Thermal Expansion of Cu Nanowires

Wen Fei Zhou,Guang Tao Fei,Xin Feng Li,Shao Hui Xu,Li Chen,Bing Wu,Li De Zhang
DOI: https://doi.org/10.1021/jp900047q
2009-01-01
Abstract:Cu nanowires with different preferred orientations were successfully fabricated in porous anodic alumina membrane (PAAM) templates by an electrochemical method. Thermal expansion of as-prepared and annealed samples embedded in PAAM templates was studied by in situ X-ray diffraction (XRD) measurement in the temperature range from 25 to 800 degrees C. For the as-prepared samples, the coefficients of thermal expansion (CTEs) of the (111), (200), and (220) planes are (7.85 +/- 0.10) x 10(-6)/degrees C, (2.91 +/- 0.08) x 10(-6)/degrees C, and (3.40 +/- 0.05) x 10(-6)/degrees C, respectively. The CTEs of annealed samples are (5.88 +/- 0.10) x 10(-6)/degrees C, (5.76 +/- 0.08) x 10(-6)/degrees C, and (5.71 +/- 0.05) x 10(-6)/degrees C, corresponding to the (111), (200), and (220) planes, respectively. The changes of vacancy configurations in XRD heating measurement are responsible for the orientation-dependent thermal expansion of as-prepared and annealed samples.
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