Properties of MgB2thick Film on Silicon Carbide Substrate

Li-Ping Chen
DOI: https://doi.org/10.1088/0953-2048/19/10/015
2006-01-01
Abstract:We have successfully synthesized MgB2 thick films on 4H-SiC substrate by hybrid physical-chemical deposition (HPCVD). The films have transition temperature T-c above 40 K. X-ray diffraction (XRD) shows the c-axis oriented structure of MgB2, with Mg and small MgO impurities. The critical current density J(c), estimated using the measured magnetic hysteresis loop and the Bean model, is 6 MA cm(-2) in self-field at 10 K.
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