PIXE-induced XRF with Transmission Geometry

XZ ZENG,XK WU,HY YAO,FJ YANG,TA CAHILL

DOI: https://doi.org/10.1016/0168-583x(93)95620-k

1993-01-01

Abstract:PIXE-induced XRF, or PIXE-XRF, is an analytical method using nearly monoenergetic X-rays from the particle bombardment of a primary target to induce X-ray fluorescence. This method gains two main advantages over the conventional PIXE method. First, with the proper selection of the primary target, the spectral interferences from major elements in the sample can be eliminated. Second, sample damage is greatly reduced, so that it is more suitable for the analysis of heat-sensitive, volatile and delicate specimens.In the present paper, a transmission geometry of the primary target for PIXE-XRF is proposed. The primary X-ray yields were calculated as the functions of primary target thickness for proton and helium particles at various energies. The selection of experimental conditions, including the primary target thickness, the ion beam and its energy, is discussed. The preliminary experimental results showed that with the transmission geometry the characteristic X-ray yields of the specimen were two orders of magnitude higher than those obtained with the reflection geometry arrangement, enabling the detection limits for both the thin and the thick target to reach sub-ppm level. Some preliminary applications are presented.