Scanning Tunneling Microscopy Study of Fullerenes
T Sakurai,XD Wang,QK Xue,Y Hasegawa,T Hashizume,H Shinohara
DOI: https://doi.org/10.1016/0079-6816(96)00005-6
IF: 7.111
1996-01-01
Progress in Surface Science
Abstract:Scanning tunneling microscopy investigations of adsorption and film growth of various fullerenes on semiconductor and metal surfaces are reviewed. The fullerenes being studied are C-60, C-70, C-84, Sc@C-82 and Y@C-82 and the substrates being used for adsorption are Si (111), Si (100), Ge (111), GaAs (110), GaAs (001), Au (111), Au (110), Au (100), Cu (111) and Ag (111) surfaces.