Scanning tunneling microscopy characterization of C70 thin films

Shengzhong Liu,Manfred M. Kappes
DOI: https://doi.org/10.1016/0040-6090(92)90884-E
IF: 2.1
1992-01-01
Thin Solid Films
Abstract:Thin films of C70 on HOP6 graphite were examined by scanning tunneling microscopy. A slightly distorted hexagonal 2D lattice and ellipsoidal molecular structure were observed.
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