Robust Partial Least Squares Regression: Part I, Algorithmic Developments

Uwe Kruger,Yan Zhou,Xun Wang,David Rooney,Jillian Thompson
DOI: https://doi.org/10.1002/cem.1093
IF: 2.5
2007-01-01
Journal of Chemometrics
Abstract:The work summarized in this paper presents the first part of a three‐paper series on robust partial least squares (RPLS) regression. Motivated by recent research activities in this area, this part provides a detailed algorithmic analysis of associated techniques, showing that existing work (i) may not represent a true robust formulation of partial least squares (PLS), (ii) may lead to convergence problems or (iii) may be insensitive to a certain type of outlier. On the basis of this analysis, Part I introduces a new conceptual RPLS algorithm that overcomes the deficiencies of existing work. The second part of this work details this new RPLS technique, compares its peformance with existing RPLS methods and provides an analysis on the computational efficiency and sensitivity of these algorithms. Whilst the first two parts of this work discuss algorithmic developments of RPLS, the final part concentrates on practical issues of RPLS implementations. This third part is devoted to practitioners of chemistry and chemical engineering covering a wide range of applications involving a calibration experiment, the analysis of recorded data from an industrial debutanizer process and data from a number of Raman spectroscopy experiments. Copyright © 2007 John Wiley & Sons, Ltd.
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