Design of Microwave Reflectivity Test System of Material at High Temperature

Zhou Liang,Deng Lianwen,Xiao Peng,Huang Shengxiang,Zhou Wei,Luo Heng,Hong Wen,Li Yang,Tang Yiqun
DOI: https://doi.org/10.3969/j.issn.1671-4598.2013.06.008
2013-01-01
Abstract:Microwave reflectivity is a very important indicator for materials' absorbing performance.Reflectivity measurement technology at room temperature is mature and has been widely used.Along with the urgency of study on high temperature absorbing materials,the materials' reflectivity measurement at high temperature is particularly important.In this paper,a set of variable temperature test platform based on the arch method is designed,which is available for the reflectivity test in the 1-40 GHz frequency range from room temperature to 1 000 ℃.In order to avoid the bending of testing plate,the package of the standard metal plate and the testing plate is improved,which is beneficial to the real time calibration and measurement at high temperature.Besides,the time domain gating function of vector network analyzer which eliminated the direct leakage signal from the sending and receiving antennas,result in better accuracy.Finally,the feasibility of the measurement system is verified by testing from different polarization,different incident angle and different temperature.
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