A Probabilistic Logics For Rs Latch In Nanoscale

Jianping Li,Xiaojun Lu,Xiaoyu Song
DOI: https://doi.org/10.1007/978-1-4020-8735-6_96
2008-01-01
Abstract:The device failure must be taken into account in the nano-scale design. This paper presents the probabilistic logic model to compute the probability distribution of the nano gate states. The characterization is based on the markov random field and statistic physics. The basic logic gates are probabilistically characterized. The effectiveness of the method is demonstrated by an 8-bit full adder. The analysis shows that the device probability distribution highly depends on the system structures and other performance parameters.
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