Abstract:This paper concerns the problem of phase retrieval from Fourier measurements with random masks. Here we focus on researching two kinds of random masks. Firstly, we utilize the Fourier measurements with real masks to estimate a general signal \begin{document}$ \mathit{\boldsymbol{x}}_0\in \mathbb{R}^d $\end{document} in noiseless case when \begin{document}$ d $\end{document} is even. It is demonstrated that \begin{document}$ O(\log^2d) $\end{document} real random masks are able to ensure accurate recovery of \begin{document}$ \mathit{\boldsymbol{x}}_0 $\end{document}. Then we find that such real masks are not adaptable to reconstruct complex signals of even dimension. Subsequently, we prove that \begin{document}$ O(\log^4d) $\end{document} complex masks are enough to stably estimate a general signal \begin{document}$ \mathit{\boldsymbol{x}}_0\in \mathbb{C}^d $\end{document} under bounded noise interference, which extends E. Candès et al.'s work. Meanwhile, we establish tighter error estimations for real signals of even dimensions or complex signals of odd dimensions by using \begin{document}$ O(\log^2d) $\end{document} real masks. Finally, we intend to tackle with the noisy phase problem about an \begin{document}$ s $\end{document}-sparse signal by a robust and efficient approach, namely, two-stage algorithm. Based on the stable guarantees for general signals, we show that the \begin{document}$ s $\end{document}-sparse signal \begin{document}$ \mathit{\boldsymbol{x}}_0 $\end{document} can be stably recovered from composite measurements under near-optimal sample complexity up to a \begin{document}$ \log $\end{document} factor, namely, \begin{document}$ O(s\log(\frac{ed}{s})\log^4(s\log(\frac{ed}{s}))) $\end{document}

Phase Extraction from Arbitrary Phase-Shifted Fringe Patterns with Noise Suppression

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Automatic Phase Recognition Method Based on Convolutional Neural Network

Selection of Phase-Recovery Algorithms for Fringe Processing in Optical Measurement of Micro-Surface

Phase Detection from Two Phase-Shifting Interferograms

Phase Extraction from Two Phase-Shifting Fringe Patterns Using Spatial-Temporal Fringes Method

Quality Weight Based on Log Modulation Amplitude for Fringe Analysis During Optical Fringe Measurement

Phase Retrieval from Fourier Measurements with Masks

Frequency-Shifting Method for Phase Retrieval from Fringe Patterns

Sampling Complexity on Phase Retrieval from Masked Fourier Measurements Via Wirtinger Flow

PHASE EXTRACTION FROM A SINGLE SPECKLE FRINGE PATTERN GUIDED BY FREQUENCIES

Novel Algorithms for Phase Retrieval

Application of the Blind Signal Separation Method for Phase-Shifting Interferometry with Random Phase Shifts

Efficient phase retrieval of two-directional phase-shifting fringe patterns using geometric constraints of deflectometry.

Phase extraction from two randomly phase shifted interferograms by combining advanced principal component analysis and Lissajous ellipse fitting

Coherence Enhancing Diffusion and Windowed Fourier Filtering for Fringe Patterns Denoising (II)

Optical phase extraction algorithm based on the continuous wavelet and the Hilbert transforms

Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase extraction from a single fringe pattern in fringe projection profilometry

A Weighted Least-Squares Algorithm for Wrapped Phase Retrieval in Sinusoidal Fringe Projection Profilometry.

A Phase Retrieval Algorithm for Complex Optical Field

Phase Extraction from Interferograms with Unknown Tilt Phase Shifts Based on A Regularized Optical Flow Method