Observation and Model of Highly Ordered Wavy Cracks Due to Coupling of In-Plane Stress and Interface Debonding in Silica Thin Films

Neng Wan,Jun Xu,Tao Lin,Ling Xu,Kunji Chen
DOI: https://doi.org/10.1103/physrevb.80.014121
IF: 3.7
2009-01-01
Physical Review B
Abstract:Highly ordered wavy cracks are observed in silica films deposited on crystalline Si wafer. The wavy crack path is interpreted in terms of the coupling of the in-plane film crack and the interface debonding. A model based on the analyzing of the crack path and the stress evolution is proposed to describe the propagation of the wavy cracks. A scaling relationship between the wavelength (lambda) and amplitude (A) is found (lambda similar to A(xi)) and the scaling factor is determined to be xi=0.47 +/- 0.01.
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