Abstract:Knowledge gained through X-ray crystallography fostered structural determination of materials and greatly facilitated the development of modern science and technology in the past century. Atomic details of sample structures is achievable by X-ray crystallography, however, it is only applied to crystalline structures. Imaging techniques based on X-ray coherent diffraction or zone plates are capable of resolving the internal structure of non-crystalline materials at nanoscales, but it is still a challenge to achieve atomic resolution. Here we demonstrate a novel lensless Fourier-transform ghost imaging method with pseudo-thermal hard X-rays by measuring the second-order intensity correlation function of the light. We show that high resolution Fourier-transform diffraction pattern of a complex amplitude sample can be achieved at Fresnel region and the amplitude and phase distributions of a sample in spatial domain can be retrieved successfully. The method of lensless X-ray Fourier-transform ghost imaging extends X-ray crystallography to non-crystalline samples, and its spatial resolution is limited only by the wavelength of the X-ray, thus atomic resolution should be routinely obtainable. Since highly coherent X-ray source is not required, comparing to conventional X-ray coherent diffraction imaging, the method can be implemented with laboratory X-ray sources, and it also provides a potential solution for lensless diffraction imaging with fermions, such as neutron and electron where the intensive coherent source usually is not available.

Application of X-ray Lens in X-ray Diffraction

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Computer Simulation of the Effect of Focusing X Rays by Means of Refractive–Diffractive Lens

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Study on the diffraction light field of two special beams through a cylindrical lens

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Experimental Study on Soft X-Ray Diffraction of a Two-Dimensional Array

Methods and application of coherent X-ray diffraction imaging of noncrystalline particles

Fourier-transform Ghost Imaging with Hard X-rays

Features of Spherical X-Ray Wave Diffraction by a Low Angle Twist Boundary Perpendicular to the Crystal Surface

An in-vacuum x-ray diffraction microscope for use in the 0.7-2.9 keV range