A Detection Method for Impurity Content of PX Product Based on Raman Spectrum

Yinan LU,Lian-kui DAI
DOI: https://doi.org/10.3969/j.issn.1004-5929.2013.04.008
2013-01-01
Abstract:This paper proposed an analysis method to calculate the impurity content in pxylene(PX)based on Raman spectroscopy.To overcome the disturbance caused by the fluctuation of laser wavelength and power,laser wavelength automatic calibration and PX characteristic peak normalized method are applied.Feature band of the impurity content was located by correlation analysis.The partial least squares(PLS)regression algorithm was used to build the quantitative analysis model within the feature band.The detection errors of toluene、ethylbenzene、m-xylene and o-xylene are±0.03%、±0.11%、±0.02% and±0.03%.The experimental result shows that this method can be an non-destructive method to determine the impurity content of PX product quickly and accurately.
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