Vacancy defects in epitaxial La<sub>0.7</sub>Sr<sub>0.3</sub>MnO<sub>3</sub> thin films probed by a slow positron beam

S W Jin,X Y Zhou,W B Wu,C F Zhu,H M Weng,H Y Wang,X F Zhang,B J Ye,R D Han
DOI: https://doi.org/10.1088/0022-3727/37/13/017
2004-01-01
Abstract:Vacancy defects in epitaxial La0.7Sr0.3MnO3 (LSMO) thin films on LaAlO3 substrates were detected using a variable energy positron beam. The line-shape S parameter of the epitaxial thin films deposited at different oxygen pressures was measured as a function of the implanting positron energy E. Our results show that the S parameter of the films changes non-monotonically with their deposition oxygen pressures. For the films deposited at lower oxygen pressures, the increase in S value in the films is attributed to the increase in oxygen vacancies and/or related defect-V-O complexes, and for those deposited at higher oxygen pressures, the larger S parameter of the films is caused by the grain boundaries and/or metallic ion vacancies. The surface morphology of the films was also characterized to analyse the open volume defects in the LSMO films.
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