A capacitor-reused cyclic ADC for high-speed CMOS image sensor

Li Binqiao,Liu Haoyang,Xu Jiangtao,Nie Kaiming,Xu Xinnan
DOI: https://doi.org/10.3969/j.issn.0258-7998.2013.03.018
2013-01-01
Abstract:In this paper,a column parallel RSD cyclic ADC using capacitor-reused technique for CMOS image sensor is presented.With the capacitor-reused technique,the ADC samples and converts the signal simultaneously in each cycle of the conversion,and thus its conversion speed is twice that of the conventional cyclic ADC.In the proposed ADC,an amplifier and four groups of capacitors are used to complete the CDS and the accurate multiply-by-two operation,which results in great reduction in the area of capacitors.The presented ADC is designed and simulated in 0.18 μm CMOS process using SPICE.The simulation results show that at a supply voltage of 1.8 V and a conversion rate of 4 MS/s,the designed ADC can achieve a SNDR of 55.61 dB and its power consumption is 1.34 mW.The ADC can satisfy 10 bit accuracy requirement of high-speed CMOS image sensor′s application.
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